EPE Association: EPE 2023 - DS3f: Measurement Techniques, Sensors and State Observers

EPE 2023 - DS3f: Measurement Techniques, Sensors and State Observers
You are here: EPE Documents > 01 - EPE & EPE ECCE Conference Proceedings > EPE 2023 ECCE Europe - Conference > EPE 2023 - Topic 04: Electrical Machines and Drive Systems > EPE 2023 - DS3f: Measurement Techniques, Sensors and State Observers

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   A High-Bandwidth and Low-Inductive Sensor for Measuring the Commutation Current of WBG Devices
By Severin KLEVER, Rik W. DE DONCKER [View]
[Download]

Abstract: Measuring the commutation current is a major challenge in the characterization of wide bandgap semiconductor devices. Commercial solutions such as coaxial shunts are not suitable for measuring very fast switching transients in the nanosecond range, as they appear in GaN applications. Therefore, new solutions are currently being researched, with both inductive and resistive sensors being considered. After a brief review of existing approaches, this paper presents a novel concept for a shunt resistor that meets the requirements of a very high bandwidth above 1 GHz and an parasitic inductance below 100 pH. These characteristics are realized via discrete thin film resistors, which are integrated into a coaxial connector on a regular multi-layer board. The solution presented is ready to use and has the advantage of a simple structure that can be easily adopted and is very cost effective. The characteristics are analyzed by simulation and validated by frequency domain measurements of several prototypes with different resistor configurations.

   A Review of Current Sensors in Power Electronics: Fundamentals, Measurement Techniques and Components to Measure the Fast Transients of Wide Bandgap Devices
By Hauke LUTZEN, Jonas MÜLLER, Nando KAMINSKI [View]
[Download]

Abstract: Accurate and reliable measurements of electrical quantities like voltage and current are essential for the power electronic systems' reliable and efficient operation. Choosing the right current sensor for a specific application is a critical point, especially for the fast transients of power semiconductor devices. This paper provides an overview of current sensor principles, clarifies the importance of selecting the right sensor, and the state of the art in current sensor technology for high di/dt and dv/dt measurements of wide bandgap devices.

   Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices
By Philipp ZIEGLER, Jörg HAARER, Philipp MARX, Mattea ECKSTEIN, André HASPEL, Jörg ROTH-STIELOW [View]
[Download]

Abstract: Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.

   Improvement of Phase-Voltage Measurement with Voltage-to-Frequency Converters via Residual-Voltage Sensing
By Tim LANGE, Anne VON HOEGEN, Nina HARTGENBUSCH, Georg Tobias GÖTZ, Rik W. DE DONCKER [View]
[Download]

Abstract: Measurement of phase voltage is a common solution to deal with disturbances introduced by voltage source inverters in drive systems. Aside from classical sample-based measurement techniques, analogintegration- based approaches offer especially easy handling of the steep voltage transitions of pulse width modulation (PWM). One such integration-based approach is the utilization of voltage-to-frequency converters (VFCs). They overcome the challenge of integrator reset by performingcharge balancing on the integrator capacitor instead of fully discharging it. Simulations and experiments indicate that measurement of disturbed phase voltage with VFCs leaves residual voltage on the integrator capacitor during this charge balancing procedure between PWM periods.This residual voltage is the physical explanation of quantization error. A new method is proposed and implemented to sense this residual voltage, compensate the quantization error and significantly increase instantaneous accuracy.

   Non-invasive wide-bandwidth current sensor for wide-bandgap devices
By Stefan MOSER, Maurizio INCURVATI, Martin SCHIESTL, Ronald STÄRZ [View]
[Download]

Abstract: Modern power electronics devices like wide-bandgap semiconductors allow for higher switching frequencies compared to existing silicon devices. Measuring the switching currents in those systems requires a wide bandwidth current measurement sensor. However, available measurement systems require modifications of the PCB due to their size and introduce therefore parasitics into the system or are limited in bandwidth. This paper deals with the design and development of an Rogowskicoil based current sensor, which allows for a low parasitic measurement of the switching current in a semiconductor device. The sensor is mounted on an adapter board, which is placed between the component and the PCB. Shielding and the geometry of the windings provide good suppression of interfering adjacent currents. Together with a wide-band integrator, fast transients in the nanosecondrange can thus be measured. Experimental verification shows good agreement with the simulation. In future applications, the system can be implemented in integrated solutions allowing an on-chip measurement.

   Sensor Faults Detection in DC Microgrids based on Unknown Input Observer
By Sen TAN, Jorge DE LA CRUZ, Juan C. VASQUEZ, Josep M. GUERRERO [View]
[Download]

Abstract: To detect the sensor faults in DC microgrids, an unknown input observer is designed with robustness against load variations and voltage perturbations using an optimization-based approach. Criteria and design process are proposed in detail to achieve a highly sensitive design. Simulations demonstrate the sensitivity and effectiveness of proposed detection method.

EPE 2023 - DS3f: Measurement Techniques, Sensors and State Observers
You are here: EPE Documents > 01 - EPE & EPE ECCE Conference Proceedings > EPE 2023 ECCE Europe - Conference > EPE 2023 - Topic 04: Electrical Machines and Drive Systems > EPE 2023 - DS3f: Measurement Techniques, Sensors and State Observers
	[return to parent folder]

	A High-Bandwidth and Low-Inductive Sensor for Measuring the Commutation Current of WBG Devices By Severin KLEVER, Rik W. DE DONCKER	[View] [Download]
Abstract: Measuring the commutation current is a major challenge in the characterization of wide bandgap semiconductor devices. Commercial solutions such as coaxial shunts are not suitable for measuring very fast switching transients in the nanosecond range, as they appear in GaN applications. Therefore, new solutions are currently being researched, with both inductive and resistive sensors being considered. After a brief review of existing approaches, this paper presents a novel concept for a shunt resistor that meets the requirements of a very high bandwidth above 1 GHz and an parasitic inductance below 100 pH. These characteristics are realized via discrete thin film resistors, which are integrated into a coaxial connector on a regular multi-layer board. The solution presented is ready to use and has the advantage of a simple structure that can be easily adopted and is very cost effective. The characteristics are analyzed by simulation and validated by frequency domain measurements of several prototypes with different resistor configurations.

	A Review of Current Sensors in Power Electronics: Fundamentals, Measurement Techniques and Components to Measure the Fast Transients of Wide Bandgap Devices By Hauke LUTZEN, Jonas MÜLLER, Nando KAMINSKI	[View] [Download]
Abstract: Accurate and reliable measurements of electrical quantities like voltage and current are essential for the power electronic systems' reliable and efficient operation. Choosing the right current sensor for a specific application is a critical point, especially for the fast transients of power semiconductor devices. This paper provides an overview of current sensor principles, clarifies the importance of selecting the right sensor, and the state of the art in current sensor technology for high di/dt and dv/dt measurements of wide bandgap devices.

	Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices By Philipp ZIEGLER, Jörg HAARER, Philipp MARX, Mattea ECKSTEIN, André HASPEL, Jörg ROTH-STIELOW	[View] [Download]
Abstract: Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.

	Improvement of Phase-Voltage Measurement with Voltage-to-Frequency Converters via Residual-Voltage Sensing By Tim LANGE, Anne VON HOEGEN, Nina HARTGENBUSCH, Georg Tobias GÖTZ, Rik W. DE DONCKER	[View] [Download]
Abstract: Measurement of phase voltage is a common solution to deal with disturbances introduced by voltage source inverters in drive systems. Aside from classical sample-based measurement techniques, analogintegration- based approaches offer especially easy handling of the steep voltage transitions of pulse width modulation (PWM). One such integration-based approach is the utilization of voltage-to-frequency converters (VFCs). They overcome the challenge of integrator reset by performingcharge balancing on the integrator capacitor instead of fully discharging it. Simulations and experiments indicate that measurement of disturbed phase voltage with VFCs leaves residual voltage on the integrator capacitor during this charge balancing procedure between PWM periods.This residual voltage is the physical explanation of quantization error. A new method is proposed and implemented to sense this residual voltage, compensate the quantization error and significantly increase instantaneous accuracy.

	Non-invasive wide-bandwidth current sensor for wide-bandgap devices By Stefan MOSER, Maurizio INCURVATI, Martin SCHIESTL, Ronald STÄRZ	[View] [Download]
Abstract: Modern power electronics devices like wide-bandgap semiconductors allow for higher switching frequencies compared to existing silicon devices. Measuring the switching currents in those systems requires a wide bandwidth current measurement sensor. However, available measurement systems require modifications of the PCB due to their size and introduce therefore parasitics into the system or are limited in bandwidth. This paper deals with the design and development of an Rogowskicoil based current sensor, which allows for a low parasitic measurement of the switching current in a semiconductor device. The sensor is mounted on an adapter board, which is placed between the component and the PCB. Shielding and the geometry of the windings provide good suppression of interfering adjacent currents. Together with a wide-band integrator, fast transients in the nanosecondrange can thus be measured. Experimental verification shows good agreement with the simulation. In future applications, the system can be implemented in integrated solutions allowing an on-chip measurement.

	Sensor Faults Detection in DC Microgrids based on Unknown Input Observer By Sen TAN, Jorge DE LA CRUZ, Juan C. VASQUEZ, Josep M. GUERRERO	[View] [Download]
Abstract: To detect the sensor faults in DC microgrids, an unknown input observer is designed with robustness against load variations and voltage perturbations using an optimization-based approach. Criteria and design process are proposed in detail to achieve a highly sensitive design. Simulations demonstrate the sensitivity and effectiveness of proposed detection method.