EPE-PEMC 1998 - Topic 01: 'Power Semiconductor Devices' | ||
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![]() | Simulation and experimental investigation of power losses in active voltage clamping circuits
By T. Reimann; R. Krümmer; J. Petzoldt | |
Abstract: Simulation and experimental investigation of power losses in active voltage clamping circuits
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![]() | The control and optimisation of IGBT turn-off characteristics under short circuit conditions
By P. W. Wheeler | |
Abstract: The control and optimisation of IGBT turn-off characteristics under short circuit conditions
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![]() | MCT versus IGBT in soft and hard switching applications
By H. Niedrist; K. Krischan; T.A. Lipo | |
Abstract: MCT versus IGBT in soft and hard switching applications
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![]() | The estimation of semiconductor's silicon temperature in the real operating conditions
By Z. Jakopovic; F. Kolonic; Z. Bencic | |
Abstract: The estimation of semiconductor's silicon temperature in the real operating conditions
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![]() | Free-wheeling diodes with improved reverse recovery by combined electron and proton irradiation
By J. Vobecky; P. Hazdra; N. Galster; E. Carrol | |
Abstract: Free-wheeling diodes with improved reverse recovery by combined electron and proton irradiation
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![]() | In-process monitoring of carier lifetime distribution in technology of large-area power semiconductor devices
By V. Benda; J. Kozisek | |
Abstract: In-process monitoring of carier lifetime distribution in technology of large-area power semiconductor devices
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![]() | A new macromodel of punch through IGBT including the temperature effect on parameters: analysis and validation
By C. Leonardi; F. Frisina; S. Musumeci; A. Raciti | |
Abstract: A new macromodel of punch through IGBT including the temperature effect on parameters: analysis and validation
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![]() | Behavior of silicon controlled avalanche diodes at high junction temperatures
By Vasile V.N. Obreja; Eugen Lakatos; Alexandru Obreja | |
Abstract: Behavior of silicon controlled avalanche diodes at high junction temperatures
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![]() | On the design of field limiting ring for improving corner breakdown voltage
By S. Y. Lee; Y. H. Lho; J. D. Kim; J. Y. Kang; J. G. Koo; K. S. Nam | |
Abstract: On the design of field limiting ring for improving corner breakdown voltage
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![]() | ASIC implementation of an incremental optical encoder
By C-tin Filote; A. Graur | |
Abstract: ASIC implementation of an incremental optical encoder
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![]() | A P-channel LDMOS transistor using a new tapered field oxide technology
By J. Kim; S. G. Kim; T. M. Roh; S. Y. Lee; J. G. Koo; K. S. Nam | |
Abstract: A P-channel LDMOS transistor using a new tapered field oxide technology
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![]() | A novel lateral SOI BMFET in DMOS structure with Bipolar-FET Operation
By Doo-Young Kim; Dae-Suk Byeon; Min-Koo Han; Won-Oh Lee; Yearn-Ik Choi | |
Abstract: A novel lateral SOI BMFET in DMOS structure with Bipolar-FET Operation
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![]() | Study of the device characteristics of the base resistance controlled thyristor with the self-align corrugated P-base
By D. S. Byeon; B. H. Lee; D. Y. Kim; M. K. Han; Y. I. Choi; W. O. Lee | |
Abstract: Study of the device characteristics of the base resistance controlled thyristor with the self-align corrugated P-base
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![]() | Post-irradiation effects in commercial power VDMOSFETs
By A. Jaksic; M. Pejovic; G. Ristic | |
Abstract: Post-irradiation effects in commercial power VDMOSFETs
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![]() | A new IGBT spice macromodel with high accuracy description of the parasitic capacitances
By A. Maxim; D. Andreu; J. Boucher | |
Abstract: A new IGBT spice macromodel with high accuracy description of the parasitic capacitances
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![]() | The insulated-gate triac (IGTR): a new three terminal bi-directional switch
By J. S. Ajit; R. Dutta; D. Kinzer | |
Abstract: The insulated-gate triac (IGTR): a new three terminal bi-directional switch
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