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 EPE-PEMC 1998 - Topic 01: 'Power Semiconductor Devices' 
 You are here: EPE Documents > 04 - EPE-PEMC Conference Proceedings > EPE-PEMC 1998 - Conference > EPE-PEMC 1998 - Topic 01: 'Power Semiconductor Devices' 
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   Simulation and experimental investigation of power losses in active voltage clamping circuits 
 By T. Reimann; R. Krümmer; J. Petzoldt 
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Abstract: Simulation and experimental investigation of power losses in active voltage clamping circuits

 
   The control and optimisation of IGBT turn-off characteristics under short circuit conditions 
 By P. W. Wheeler 
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Abstract: The control and optimisation of IGBT turn-off characteristics under short circuit conditions

 
   MCT versus IGBT in soft and hard switching applications 
 By H. Niedrist; K. Krischan; T.A. Lipo 
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Abstract: MCT versus IGBT in soft and hard switching applications

 
   The estimation of semiconductor's silicon temperature in the real operating conditions 
 By Z. Jakopovic; F. Kolonic; Z. Bencic 
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Abstract: The estimation of semiconductor's silicon temperature in the real operating conditions

 
   Free-wheeling diodes with improved reverse recovery by combined electron and proton irradiation 
 By J. Vobecky; P. Hazdra; N. Galster; E. Carrol 
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Abstract: Free-wheeling diodes with improved reverse recovery by combined electron and proton irradiation

 
   In-process monitoring of carier lifetime distribution in technology of large-area power semiconductor devices 
 By V. Benda; J. Kozisek 
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Abstract: In-process monitoring of carier lifetime distribution in technology of large-area power semiconductor devices

 
   A new macromodel of punch through IGBT including the temperature effect on parameters: analysis and validation 
 By C. Leonardi; F. Frisina; S. Musumeci; A. Raciti 
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Abstract: A new macromodel of punch through IGBT including the temperature effect on parameters: analysis and validation

 
   Behavior of silicon controlled avalanche diodes at high junction temperatures 
 By Vasile V.N. Obreja; Eugen Lakatos; Alexandru Obreja 
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Abstract: Behavior of silicon controlled avalanche diodes at high junction temperatures

 
   On the design of field limiting ring for improving corner breakdown voltage 
 By S. Y. Lee; Y. H. Lho; J. D. Kim; J. Y. Kang; J. G. Koo; K. S. Nam 
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Abstract: On the design of field limiting ring for improving corner breakdown voltage

 
   ASIC implementation of an incremental optical encoder 
 By C-tin Filote; A. Graur 
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Abstract: ASIC implementation of an incremental optical encoder

 
   A P-channel LDMOS transistor using a new tapered field oxide technology 
 By J. Kim; S. G. Kim; T. M. Roh; S. Y. Lee; J. G. Koo; K. S. Nam 
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Abstract: A P-channel LDMOS transistor using a new tapered field oxide technology

 
   A novel lateral SOI BMFET in DMOS structure with Bipolar-FET Operation 
 By Doo-Young Kim; Dae-Suk Byeon; Min-Koo Han; Won-Oh Lee; Yearn-Ik Choi 
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Abstract: A novel lateral SOI BMFET in DMOS structure with Bipolar-FET Operation

 
   Study of the device characteristics of the base resistance controlled thyristor with the self-align corrugated P-base 
 By D. S. Byeon; B. H. Lee; D. Y. Kim; M. K. Han; Y. I. Choi; W. O. Lee 
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Abstract: Study of the device characteristics of the base resistance controlled thyristor with the self-align corrugated P-base

 
   Post-irradiation effects in commercial power VDMOSFETs 
 By A. Jaksic; M. Pejovic; G. Ristic 
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Abstract: Post-irradiation effects in commercial power VDMOSFETs

 
   A new IGBT spice macromodel with high accuracy description of the parasitic capacitances 
 By A. Maxim; D. Andreu; J. Boucher 
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Abstract: A new IGBT spice macromodel with high accuracy description of the parasitic capacitances

 
   The insulated-gate triac (IGTR): a new three terminal bi-directional switch 
 By J. S. Ajit; R. Dutta; D. Kinzer 
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Abstract: The insulated-gate triac (IGTR): a new three terminal bi-directional switch