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An Empiric Approach to Establishing MOSFET Failure Rate Induced by Single-Event Burnout
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| Author(s) |
Jeroen van Duivenbode and Bart Smet |
| Abstract |
Although the detrimental effect of Single- Event Burnout on semiconductors has been known for over two decades, component manufacturers publish little related data. Through extensive testing, the authors have established trustworthy reliability figures and demonstrate that Single-Event Burnout has a remarkably high impact on power converter failure rate. A standard testing method is proposed for improved power semiconductor qualification testing. |
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| Filename: | 671.pdf |
| Filesize: | 1.144 MB |
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| Type |
Members Only |
| Date |
Last modified 2008-12-07 by System |
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