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High temperature characterization of SiC-JFET and modelling
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| Author(s) |
MOREL Herve; RAYNAUD Christophe; PLANSON Dominique; MOUSA Rami |
| Abstract |
Silicon Carbide (SiC) is considered as the wide band gap semiconductor material that can presently compete with Silicon (Si) material for power switching devices. Compact circuit simulation models for SiC devices are of extreme importance for designing and analyzing converter circuit, in particular, if comparisons with Si devices should be performed. In this paper, three different kinds of Silicon Carbide JFET samples were characterized at temperatures up to 225C. The characterization is based on the DC (Current - Voltage) characteristic measurements using a curve tracer and on the AC (Capacitance - Voltage) measurements using an impedance analyzer. We keep in mind to establish an analytical model that will be used in the design of a power converter. |
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| Filename: | 0464-epe2007-full-13172720.pdf |
| Filesize: | 1.391 MB |
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| Type |
Members Only |
| Date |
Last modified 2008-01-11 by System |
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