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Automated Testing of Power Semiconductor Devices
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| Author(s) |
Sven Tschirley, Steffen Bernet |
| Abstract |
Testing power semiconductor devices for a new
product design or a qualification in the development process
is nescessary to ensure a good device utilization. Benchmarking
devices and verification of datasheet specifications cause high cost
in the pre-design phase of new products. This paper describes the
design of a test system that enables automated testing of modern
power semiconductor devices. Examples are given by measuring
and calculating the turn-off losses of the 10 kV IGCT. |
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| Filename: | 064 |
| Filesize: | 475.1 KB |
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| Type |
Members Only |
| Date |
Last modified 2006-02-08 by System |
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