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   current measurement dedicated mixed System-on-Chip for highly integrated power control   [View] 
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 Author(s)   POURE Philippe; BRAUN Francis; HEBRARD Luc; FRICK Vincent 
 Abstract   This paper focused on the design and prototyping of a contactless current measurement System-On-Chip (SoC) in standard CMOS technology. Thus, without additional post-processing cost, a differential architecture, including two improved Hall plates, embedded electronics and auto-balancing is described. Experimental results measured on a 0.6mm CMOS technology prototype demonstrate the functionality of the SoC. This one will be integrated in further highly integrated power control. 
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Filename:0025
Filesize:385.4 KB
 Type   Members Only 
 Date   Last modified 2006-02-05 by System