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   Experimental Evaluation Of The Influence Of Modern Mosfet Devices On The Phase Node Ringing In Vrm Power Converters   [View] 
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 Author(s)   S. Musumeci, R. Pagano, A. Raciti, G. Belverde, C. Guastella, M. Melito 
 Abstract   The paper deals with the impact of the last generation MOSFETs on the ringing phenomenon occurring on the phasenode of a buck converter, which is utilized as voltage regulator module (VRM). In particular, the present paper deals with the behavior of the converter with reference to the low-side MOSFET switch. In fact, the impact of the device behavior has been analyzed in order to better understand the effects on the voltage transient of the phase-node. The influence of the electrical parameters that concern this topic, such as the gate equivalent impedance and the board layout influence, has been investigated in an actual buck converter. Moreover, aiming to individuate a good solution to limit the parasitic transient, two different choices of the low-side switch have been realized by implementing a trench-MOSFET and a strip-layout MOSFET. Finally, the main theoretical and experimental results are analyzed and discussed. 
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Filename:A14367
Filesize:499.7 KB
 Type   Members Only 
 Date   Last modified 2006-02-15 by System