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The soft-switching tester and application
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| Author(s) |
I. Feno; P. Spanik; I. Lokseninec |
| Abstract |
An effort to experimentally evaluate the classical
and new soft-switching techniques led to a new
“tester” development and construction. The purpose
of this equipment is to evaluate individual loss
components that are inherent to a semiconductor
device brand and individual soft-switching
techniques used. A construction design and
individual schematic diagrams of the tester are
presented. Application examples of the tester and
experimental results are shown as well. |
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| Filename: | EPE2003-PP0285 - Feno |
| Filesize: | 763.4 KB |
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| Type |
Members Only |
| Date |
Last modified 2003-10-16 by Unknown |
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