| Measurement of multiple chip currents in a press-pack IGBT using Rogowski coils | ||
| Author(s) | B. Bock; E. U. Krafft; A. Steimel | |
| Abstract | The currents of single chips parralleled inside a 4.5kV / 2kA press-pack IGBT are measured with Rogowski coils to investigate the static and dynamic distribution of the total current inside the device. Because of the low magnitude of the signals, an especially careful calibration and measurement strategy is needed. The measurements reveal static and dynamic inhomogeneities as well as significant current redistributions during turn-off. | |
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| Type | Members Only | |
| Date | Last modified 2004-01-27 by Unknown | |
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