Higher switching frequencies are required to reduce the weight and size of passive energy storing components in power electronics systems. Switching loss reduction through soft commutation techniques such as zero-current-(ZCS) and zero-voltage switching (ZVS) is widely applied in converter designs. Test circuits are commenly used for the characterization of the switching behavior of semiconductor power devices in order to better evaluate their switching losses. This work presents the operation and design considerations of two special test circuits used for the characterization of IGBTs in ZCS commutation. The study considers the variation of important test parameters such as the hold-off time. IGBT turn-off instant, switched current, supply voltage and junction temperature.
| Filename: | EPE Journal - 11-1 - 3 - Paper Claudio |
| Filesize: | 1.151 MB |
