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A Long Term Test Set-Up for Evaluation of High Power IGBT-Modules
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| Author(s) |
G. Zaiser; R. Sommer; T. Franke |
| Abstract |
This paper describes a new long term test set-up for high power IGBTs. The IGBTs are
operating under realistic conditions. The test set-up not only controls the power circuit,
but also measures the characteristic parameters of the IGBT modules, including
switching losses, saturation voltages, leakage currents and thermal resistances. Results
from a long term test of six months of operation under full load are presented. The results
show an excellent long-term stability of the high voltage IGBT modules showing that the
IGBT is suitable for high reliability drives in traction and industrial applications. |
| Download |
| Filename: | EPE1999 - PP00368 - Zaiser.pdf |
| Filesize: | 93.73 KB |
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| Type |
Members Only |
| Date |
Last modified 2004-03-24 by System |
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