| |
Static vs. Dynamic Characterization of p-GaN HEMTs: Discrepancies in Electrical Characteristics and their Dependence on Bias History
| [View]
[Download]
|
| Author(s) |
Ludovic ROCHE, David TRÉMOUILLES, Emmanuel MARCAULT, Corinne ALONSO |
| Abstract |
Quasi-static electrical characteristics of p-GaN HEMTs fluctuate with bias history. This study evidences that dynamic operation is fortunately highly reproducible without pre-conditioning. The original experimental setup highlights that quasi-static data alone is insufficient for modeling dynamic behavior, while allowing precise detection of discrepancies, enabling improved transient modeling. |
| Download |
| Filename: | 0309-epe2025-full-15325282.pdf |
| Filesize: | 464 KB |
|
| Type |
Members Only |
| Date |
Last modified 2025-08-31 by System |
| |
 |