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Novel Control Methodologies of Back-to-Back B6 Bridges for an Application-Related Stress Test Setup
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| Author(s) |
Andreas WARMUTH, Kevin KAPAJ, Alexander ULBING |
| Abstract |
Back-to-back (B2B) B6 bridges stand out as the go-to solution for power cycling and application related stress tests in the reliability sector of power electronics. This paper delves into novel control strategies for the electro-thermal stress reconstruction of Device-under-Tests (DUTs), with a specific focus on signal shape reconstruction and current ripple reduction. A novel precalculation method is introduced, enabling the prediction of an operating point for open-loop control, thus facilitating the reconstruction of complex signal shapes. The presented concepts are rigorously evaluated through hardware testing and real measurement results, underlining their practical viability in real-world applications. |
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| Filename: | 0062-epe2025-full-07112668.pdf |
| Filesize: | 1.319 MB |
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| Type |
Members Only |
| Date |
Last modified 2025-08-31 by System |
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