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   Effects of Removing Bottom-side Copper in Baseplate-less Power Modules   [View] 
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 Author(s)   Nikolaj KRISTENSEN, Jakob IVERSEN DEICHGRAEBER, Kerim BRACKOVIC, Szymon BECZKOWSKI, Stig MUNK-NIELSEN, Asger BJØRN JØRGENSEN 
 Abstract   Performance of SiC MOSFETs are limited by theinherent parasitic elements originating from thepackaging structure. In this paper, the parasiticcapacitance of a 1.2 kV SiC MOSFET half-bridgepower module is significantly reduced by removingthe bottom-side copper, and the influence onits electrical and thermal performance is experimentallyevaluated. Finally it is concluded thateven though the modified module show significantadvantages in turn-on switching energy, anincrease in turn-off energy offsets it while alsoachieving a worse thermal performance. 
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Filename:0190-epe2025-full-17293604.pdf
Filesize:1.425 MB
 Type   Members Only 
 Date   Last modified 2025-08-31 by System