| |
Systematic Derivation and Experimental Verification of a Compact Loss Model for Soft-switching Half-bridges
| [View]
[Download]
|
| Author(s) |
Tianxiao CHEN, Pedro Andre MARTINS BEZERRA, Zhengyan HE, Gengqi LI, Eckart HOENE |
| Abstract |
Soft-switching Half-Bridges (HBs) experi-ence switching losses, even under zero-voltage-switching(ZVS) conditions, due to hysteresis losses during thecharging and discharging of the output capacitor inthe switching devices. This paper presents a systematicderivation and experimental verification of a compact lossmodel that incorporates hysteresis losses for soft-switchingHBs. The model is generated by extracting parasitics,including measuring hysteresis losses using the Sawyer-Tower Method (STM). The hysteresis losses are modeledas losses occurring on an equivalent resistor connectedin series with the output capacitor. Measurement resultsindicate that at test frequencies above 10 MHz, hysteresislosses can account for over 30\% of the energy stored in theoutput capacitor for tested low-voltage Si MOSFETs. Thisfinding demonstrates the significant impact of hysteresislosses on damping effects following switching events. Theproposed model is verified through the Double Pulse Test(DPT), with a prediction error of switching-off losses below10\% under different operating conditions. |
| Download |
| Filename: | 0407-epe2023-full-22404953.pdf |
| Filesize: | 4.343 MB |
|
| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
| |
 |