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Switching losses in power devices: From dynamic on resistance to output capacitance hysteresis
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| Author(s) |
Elison MATIOLI, Hongkeng ZHU, Nirmana PERERA, Mohammad SAMIZADEH NIKOO, Armin JAFARI |
| Abstract |
In this paper, we review some of the main methods to characterize on-state and off-state losses in wide-band-gap devices under switching conditions. In the off-state, we will discuss about losses related to charging and discharging the output capacitance in wide-band-gap devices, both in hard- and soft-switching. In the on-state, we will present an accurate measurement of dynamic on-resistance degradation, particularly in Gallium Nitride (GaN) devices. These losses are typically not described in data-sheets, but can be a dominant loss mechanism in power electronic applications. |
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| Filename: | 0594-epe2023-full-10081406.pdf |
| Filesize: | 842.3 KB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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