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Investigation on the Thermal Stability of Silicon-carbide MOSFETs operating in Controlled Shoot-through mode
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| Author(s) |
Alessandro SOLDATI, Vishal UNDRE, Roberto MENOZZI |
| Abstract |
The Controlled Shoot-Through technique is an emerging and promising one for thermal control and monitoring of power MOSFETs. In this work we investigate the thermal stability of the power device in current-controlled mode at low gate voltages, to identify the effects of long pulses, as needed by in-circuit thermal analysis. |
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| Filename: | 0379-epe2023-full-11081922.pdf |
| Filesize: | 561.3 KB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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