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In-Depth Study of the Parasitic Capacitances of a Half-bridge Circuit
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| Author(s) |
Samuel FABER, Benedikt KOHLHEPP, Julian DOBUSCH, Jeremias KAISER, Thomas DÜRBAUM |
| Abstract |
Wide bandgap power devices are pushing the trend of increasing switching frequencies even further, giving rise to a frequency shift of EMC noise. As a result, parasitic elements gain significantly in importance. For this reason, parasitic capacitances of a half-bridge circuit PCB are studied by means of numerical simulations. After an introduction into the half-bridge circuit in terms of CM noise, the focus is layed on the simulation methods applied, the generation of a suitable simulation model as well as the development of a more intuitive equivalent circuit. Simulation results for typical measurement conditions are presented and compared with each other. |
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| Filename: | 0193-epe2023-full-08085549.pdf |
| Filesize: | 486.7 KB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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