| |
Fully Automated Wide Temperature Range Semiconductor Characterization
| [View]
[Download]
|
| Author(s) |
Simon Robin FRANK, Jan HANSEL, Jannik BITTERLE, Rüdiger SCHWENDEMANN, Marc HILLER |
| Abstract |
This paper introduces a fully automatedtest bench for -75°C up to 160°C static and dynamicsemiconductor characterization. First measurements performedwith a 1.2 kV, 200 A Si-IGBT module and a 1.2 kV,250 A SiC-MOSFET module show better semiconductorperformance at lower temperatures compared to the conventionalhigh temperature operation. |
| Download |
| Filename: | 0497-epe2023-full-14145110.pdf |
| Filesize: | 3.832 MB |
|
| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
| |
 |