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Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices
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| Author(s) |
Zhebie LU, Francesco IANNUZZO |
| Abstract |
Obtaining the characteristics of the device is a key procedure before practical applications. Here inthis paper, the design of a device test platform for wide-bandgap devices is introduced. The platform has a high noise immunity, low loop inductance, and fast overcurrent protection, realizing a non-destructive operation. |
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| Filename: | 0332-epe2023-full-10545320.pdf |
| Filesize: | 921.2 KB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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