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Comparison of a Power Cycling Test using Repetitive Unclamped Inductive Switching for Heat Generation with the DC Power Cycling Test
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| Author(s) |
James ABUOGO, Christian SCHWABE, Josef LUTZ, Thomas BASLER |
| Abstract |
A power cycling test using repetitive unclamped inductive switching to generate heat is applied on low voltage silicon MOSFETs. The motivation of this approach is to introduce avalanche-generated losses, besides the conduction losses, so that the required load current can be reduced. This is important in testing low voltage MOSFETs, whereby the small on-state resistance often demands that the rated current be exceeded to achieve the desired temperature swing. The performance of this test approach is compared to that of a classical DC power cycling test in body-diode mode. The results obtained from these two tests - both lifetimes and failure modes - are found to be similar. The switching test required only 42\% of the load current of the DC test. The static parameters of the devices deployed in both tests also showed similar changes. |
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| Filename: | 0027-epe2023-full-11105175.pdf |
| Filesize: | 494 KB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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