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Active Thermal Control of a DC-DC Converter Using Dynamic Gate-drive for Reliability Improvement
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| Author(s) |
Farzad HOSSEINABADI, Olcay BAY, Sachin Kumar BHOI, Sajib CHAKRABORTY, Mohamed EL BAGHDADI, Omar HEGAZY |
| Abstract |
In this article, a new approach for smoothing junction temperature fluctuations through active thermal control is proposed. By utilizing a current-source gate drive and controlling switching transition, switching losses can be regulated in a way to control junction temperature swing which is a dominant reason of wear-out failure mechanisms in MOSFETs. The simulation results indicate a 29\% increase in lifetime. Additionally, the experimental results demonstrate the capability of this approach to control the junction temperature of a MOSFET effectively. |
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| Filename: | 0266-epe2023-full-18495400.pdf |
| Filesize: | 495.4 KB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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