| |
A model-based approach for prognostics of power semiconductor modules
| [View]
[Download]
|
| Author(s) |
Aleksi VULLI, Gerd SCHLOTTIG, Michal ORKISZ, Marcin FIRLA, Enea BIANDA |
| Abstract |
We developed a model-based approach for prognostics of power semiconductor modules, including novel physics-inspired damage progression models for chip and system solder degradation, stemming from temperature variations. Particle-filter-based methodology enables estimation of the module's current health, forecast of the two concurrently progressing damage mechanisms, and finally prediction of the remaining useful life. In this publication we demonstrate the approach in the case of chip solder degradation. |
| Download |
| Filename: | 0311-epe2023-full-02404661.pdf |
| Filesize: | 1.248 MB |
|
| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
| |
 |