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A Data-Driven Thermal Digital Twin of a 3-Phase Inverter using Hi-Fidelity Multi-Physics Modelling
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| Author(s) |
Sachin Kumar BHOI, Mohamed Amine FRIKHA, Gamze Egin MARTIN, Farzad HOSSEINABADI, Sajib CHAKRABORTY, Mohamed EL BAGHDADI, Omar HEGAZY |
| Abstract |
The assessment of Power Electronics Converters (PECs) reliability is a crucial research area forthe development of robust PECs. The key parameter for reliability assessment is the real-time junction temperature (Tj ) profile for semiconductor power switches of PECs. While complex high-fidelity simulation models with electro-thermal models can accurately predict Tj during the offline design phase, their computational requirements make them impractical for real-time applications. This paper proposes a methodology to develop a real-time hardware deployable model for estimating the junction temperature of an Insulated Gate Bipolar Transistor (IGBT) power device. A data-driven reduced-order model(ROM) of an industrial inverter setup based on a highfidelity multiphysics simulation model is presented in the article. This work also contributes to the realization ofvirtual sensors and digital twins for PECs. |
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| Filename: | 0392-epe2023-full-23420872.pdf |
| Filesize: | 2.104 MB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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