| Filename: | 0146-epe2022-full-14243250.pdf |
| Filesize: | 3.13 MB |
| Powercycling Test Bench with Realistic Loss Distribution and Temperature Ripples | ||||||
| Author(s) | Till-Mathis PLÖTZ | |||||
| Abstract | An innovative test bench is presented, which allows the powercycling for semiconductors under a super-position of temperature ripples with different frequencies. In addition to the implementation of switchinglosses, this creates loadpatterns which are similar to the application. Further, the leakage current of thesemiconductors as a thermo-sensitive parameter is introduced. First results validate the concept. | |||||
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| Type | Members Only | |||||
| Date | Last modified 2023-09-24 by System | |||||
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