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   Impact of Bond Wire Configuration on the Power Cycling Capability of Discrete SiC-MOSFET Devices   [View] 
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 Author(s)   Patrick HEIMLER 
 Abstract   This work investigates the power cycling capability of SiC MOSFETs (60 mO/1200 V) in TO-247-packages with two different bonding configurations. As a result, a difference in lifetime by a factor of1.5 to 2 is determined. The failure mode was an increase in forward voltage drop by degradation of thebond wire connection. The ANSYS simulations (thermal-electrical and mechanical) confirm thatseveral thinner bond wires have a higher power cycling capability compared to a few bond wires withlarger diameters. 
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Filename:0241-epe2022-full-16080443.pdf
Filesize:855.2 KB
 Type   Members Only 
 Date   Last modified 2023-09-24 by System