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Dynamic Load Emulation for Automotive Power IC Robustness Validation
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| Author(s) |
Alexander ULBING |
| Abstract |
This paper addresses the gap in application related stress testing for automotive power IC qualifications as well as for development-related testing to make ICs more robust. To make test systems more efficient and reduce the cost per test slot the concept of dynamic load emulation has been evaluated. An approach taken by industrial power converters has been adapted to fit the needs of the low power automotive drive domain. To prove the concept and show how application relevant stress could be applied to the device under test simulations are done. In a further step a dedicated hardware test bench has been created and the applicability of the concept within the automotive domain was verified. Several measurements are shown to demonstrate the functionality as well as possible improvements and next steps are discussed. |
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| Filename: | 0552-epe2022-full-11442563.pdf |
| Filesize: | 2.713 MB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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