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Design of a High-Dynamic Test Bench for Accelerated Dielectric LifetimeTesting with adjustable Voltage Slopes and Temperatures
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| Author(s) |
Hendrik SCHEFER |
| Abstract |
Upcoming future mobility will require high power densities; therefore, wide bandgap semiconductors(WBGs) and HVDC supply voltage could be one solution. One crucial design criterion is the insulationcoordination in all drive train components. This paper presents and discusses a test bench design toemulate dielectric stress due to fast switching and hard switching WBGs at high voltages and variousenvironmental conditions. |
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| Filename: | 0159-epe2022-full-07520130.pdf |
| Filesize: | 2.008 MB |
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| Type |
Members Only |
| Date |
Last modified 2023-09-24 by System |
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