| Abstract |
A pulse generator consisting of a transmission line transformer and GaN-based full bridge for generating high-repetitive impulse voltage stress with a high slew rate is proposed. GaN-half-bridges are used to generate fast switching edges, while the wide-band transmission line transformer is adopted to achieve the required voltage gain for an accelerated test without losing the interested high-frequency components contained in the fast edges. Another benefit of using the transmission line transformer is the spatial separation of pulse generation at room temperature and devices under test in a climate chamber, where the temperature for an accelerated test can be up to 150°C. The detailed operation principle, design considerations, simulation implementation, and experimental results for the proposed pulse generator are also presented. A peak-to-peak voltage of 400V x 8 and a maximal voltage slew rate of 250 V/ns have been achieved. |
