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   Turn-off overvoltage characterization and mitigation in wide bandgap power transistors   [View] 
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 Author(s)   Junyun DENG 
 Abstract   Turn-off ringing is a challenge caused by parasitic elements in power loop, resulting in switchinglosses, voltage breakdown and EMI issues. A worse case occurs while employing wide bandgappower transistors due to their fast turn-off. The conventional way to mitigate turn-off ringing isto reduce the commutation loop inductance or slow down transistors' switching speed. However,slow turn-off speed is undesirable due to low switching loss. In this work, it is demonstrated thatfast turn-off of wide bandgap(WBG) transistors can facilitate minimizing voltage overshoot withwell-tuned parasitic loop inductance. Based on the characterization of the turn-off transition,an analytical model is derived that shows voltage overshoot can be reduced without sacrificinglow turn-off loss and simple PCB layout while allowing high loop inductances. The proposedtechnology can fully exploit the potential of wide bandgap transistors in extremely fast switchingconditions. 
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Filename:0427-epe2021-full-11415255.pdf
Filesize:457.7 KB
 Type   Members Only 
 Date   Last modified 2022-03-15 by System