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   ACCOMODATING PARASITIC EFFECTS IN HIGH-FREQUENCY POWER-STAGES   [View] 
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 Author(s)   F. V. P. Robinson; B. W. Williams 
 Abstract   RC-snubber optimization still contains a large degree of empiricism because assumptions about device current-fail and snubber-component parasitic effects are imprecise. This becomes evident when applying small RC-snubbers to medium frequency (10-100kHz) MOSFET and IGBT power-stages, where snubber capacitance may approach device output-capacitance and where low-cost snubber-resistor parasitic inductance often exceeds the inductance being clamped. Methods of overcoming these and other difficulties, associated with very fast transient suppression, are presented, together with a re-assessment of existing RC-snubber optimization methods. 
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Filename:Unnamed file
Filesize:1.018 MB
 Type   Members Only 
 Date   Last modified 2021-02-15 by System