| Abstract |
Considerable efforts have been made to estimate the lifetime of power devices, e.g., IGBTs, whenthey are subjected to a specific loading profile, which is affected by real field mission profiles. Inthose cases, a yearly mission profile, e.g., ambient temperatures, wind speeds and solar irradiancelevels, is adopted. However, the prior art assumes that the same accumulated damage is caused ineach year during the operation of the solutions. In practice the mission profile will vary, makingthe assumption invalid. This paper thus examines the assumption of equally distributed damageaccumulation throughout the lifetime, by analyzing multiple years of mission profiles. |
