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Combining multiple temperature-sensitive electrical parameters using artificial neural networks
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| Author(s) |
Daniel HERWIG |
| Abstract |
Temperature-Sensitive Electrical Parameters (TSEPs) are often discussed for on-line determination of the junction temperature of semiconductors, and as key parameters for condition monitoring. This paper focuses on the combination of several simultaneously captured TSEPs using Artificial Neural Networks(ANNs) to reduce cross-dependencies and improve accuracy. |
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| Filename: | 0332-epe2020-full-16091019.pdf |
| Filesize: | 256.4 KB |
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| Type |
Members Only |
| Date |
Last modified 2021-01-18 by System |
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