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The Sensitivity Analysis of the Base Resistance for the BRT Employing Corrugated P-Base
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| Author(s) |
J-K. Oh; M-S. Lim; W-O. Lee; M.-W. Ha; M-K. Han; Y-I. Choi |
| Abstract |
We report the process sensitivity of the self align corrugated p-base resistance which improves
the electric characteristics of the CB-BRT and the SB-EST. Experimental results and simulation
results show that the process sensitivity of the corrugated p-base resistance is much better than that of
the conventional p-base. |
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| Filename: | EPE2001 - PP00946 - Oh.pdf |
| Filesize: | 144.5 KB |
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| Type |
Members Only |
| Date |
Last modified 2004-03-10 by System |
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