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   VDMOS IPM with novel overtemperature protection   [View] 
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 Author(s)   Z. Lisik; Z. Szczepaniak; J. Szmidt 
 Abstract   A new approach to temperature monitoring of VDMOS transistors in intelligent power modules (IPM), which use the channel resistance as the temperature sensitive parameter is presented. The usefulness of the proposed solution has been checked in a IPM mode. The overtemperature monitoring circuit designed for the module has been examined. 
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Filename:EPE2001 - PP00442 - Lisik.pdf
Filesize:51.56 KB
 Type   Members Only 
 Date   Last modified 2004-03-10 by System