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Total Harmonic Distortion Analysis in Magnetic Characterization using High Frequency GaN Inverter in the MHz Order
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Author(s) |
Wilmar MARTINEZ |
Abstract |
This paper introduces the THD analysis when comparing iron loss characterization procedures using clamp type current probes and high precision shunt resistances at high carrier frequency excitation with a GANFET inverter. As a result of this procedure, the measurements using shunt resistances shown an easier way to compensate the error injected by the sensor. |
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Filename: | 0409-epe2019-full-11093994.pdf |
Filesize: | 1.293 MB |
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Type |
Members Only |
Date |
Last modified 2020-08-14 by System |
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