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   SiC Diode Characterization using Pulsed S-Parameter Measurements   [View] 
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 Author(s)   Martin HERGT 
 Abstract   Considering to power converter systems, the characterization and modeling of wide band gap semiconductors at switching frequencies in the MHz area are very important. In the following a method is presented in order to characterize and build up a non-linear model for a diode at frequencies up to 500 MHz. 
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Filename:0427-epe2019-full-14504343.pdf
Filesize:770.4 KB
 Type   Members Only 
 Date   Last modified 2020-08-14 by System