| Abstract |
Aging of MPPF capacitors have been studied in this paper with the aim to improve their reliability regarding their design. The study is performed for three series of capacitors having the same capacitance but different geometry. Two types of aging were considered for the study. At the first stage, the three series of capacitors are subjected to electric stresses which consist in passing a strong sinusoidal current through the component under test. The test current is selected in such a way as not to exceed, in the worst of cases, maximum temperature supported by the element, namely around 90 °C, where the polypropylene starts to experience a shrinkage phenomenon. As a second test, the elements were overstressed by voltage and temperature. The experiments proved that long capacitor deteriorates faster than a plateshaped having the same features. |
