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   Gate Voltage Fluctuation Reduction in Fast-switching Operation for Uninterruptible Power System with SiC-MOSFET   [View] 
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 Author(s)   Hiroshi KAMIZUMA 
 Abstract   A low noise gate drive architecture for uninterruptible power systems with SiC-MOSFET was developed. An active miller clamp circuit with dumping resistance was applied to the gate drive circuits to reduce gate voltage fluctuation caused by common source inductance in fast-switching operation. As a result, a 200 V / 20 kVA UPS achieves high efficiency of 93.7\%. 
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Filename:0382-epe2019-full-15593897.pdf
Filesize:3.054 MB
 Type   Members Only 
 Date   Last modified 2020-08-14 by System