| |
Comparison of Semiconductor Device Losses in Hard Switched and Zero Voltage Switched Inverter Systems
| [View]
[Download]
|
| Author(s) |
M. Dehmlow; K. Heumann; R. Sommer |
| Abstract |
This paper presents a detailed investigation of losses in IGBT modules in hard switched PWM and Zero Voltage Switched Inverter Systems. To measure the semiconductor device losses a one phase test circuit in which the semiconductor devices are stressed in similar way as in a real inverter system is described. The test circuit allows the investigation of the semiconductor devices in a hard switched inverter, an Active Clamped Resonant DC Link Inverter, and an Auxiliary Resonant Commutated Pole Inverter. |
| Download |
| Filename: | Unnamed file |
| Filesize: | 3.785 MB |
|
| Type |
Members Only |
| Date |
Last modified 2019-07-25 by System |
| |
 |