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TURN-OFF BEHAVIOR OF STRUCTURED MCT CELLS
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| Author(s) |
H. Dettmer; H. Lendenmann; J. Bürgler; S. Müller; W. Fichtner |
| Abstract |
We have investigated the turn-off behavior of MOS-controlled thyristors (MCTs) using multi-dimensional numerical process and device modeling tools. The device structures include single MCT cells as well as multi-cell ensembles. The calculations emulate real-life situations by incorporating external networks (inductors, resistances, diodes, capacitors). The results show both the excellent current handling capabilities of individual cells and the susceptibility of ensembles to current inhomogenities. We find filamentation to be a strong function of the structural optimization of an ensemble. More important, we can show that it can be suppressed by proper cell arrangement. The simulation results have been verified by measurements of MCT's with different cell structures. |
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| Filename: | Unnamed file |
| Filesize: | 2.105 MB |
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| Type |
Members Only |
| Date |
Last modified 2019-07-16 by System |
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