| Filename: | 0025-epe2018-full-13475653.pdf |
| Filesize: | 698.5 KB |
| Reliability prediction of SiC MOSFET based on actual mission profile of SSPC | ||||||
| Author(s) | Qingwen CHEN | |||||
| Abstract | In order to solve the reliability problem of Solid State Power Controller (SSPC), focusing on its internal weak point, the paper carries out reliability prediction of SiC MOSFET based on Physics of Failure (PoF) model under actual mission profile of SSPC, which seems to be more accurate and reliable.. | |||||
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| Type | Members Only | |||||
| Date | Last modified 2019-05-05 by System | |||||
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