| Abstract |
Today, performing life tests on power semiconductor devices is of major importance in industrial and automotive power applications. Traditionally, qualification tests, like the HTOL test, are carried out in a semi-automated manner. This paper first reviews different test methods and a recently proposed modular test system (MTS) that allows testing of individual devices as well as application specific tests. The MTS can automatically deliver significantly more information on the reliability of the device under test (DUT) . Then, the performance enhancement of HTOL testing through use of a new embedded system is demonstrated. |
