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Systematic procedure to map the validity range of insulated-gate device models
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| Author(s) |
B. Allard; H. Morel; W. Mi; G. Hatem; K. Ammous; D. Bergogne |
| Abstract |
The paper presents original maps of model validity ranges. The validity range of an identified device model is
rarely discussed in literature. Indeed the information is essential to let the engineer quantify the validity of a
simulation. The fact is more and more important when a prototype-less design is required to design a power
converter.
Essentialy a validity map plots parameters versus operating conditions. Switching parameters are preferred to
waveforms to quantify a device model validity range. A systematic procedure estimates the switching parameters
from specific test-benches. The experimental setup is modeled and switching parameters are extracted similarly
from simulated waveforms. Test-benches and associated procedures are detailed. The model parameter
identification and validity maps are discussed for insulated-gate devices. |
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| Filename: | EPE2003-PP0312 - Allard |
| Filesize: | 608.5 KB |
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| Type |
Members Only |
| Date |
Last modified 2003-10-14 by Unknown |
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