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A CRITICAL EVALUATION OF MODERN IGBT-MODULES
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| Author(s) |
Frede Blaabjerg; John K. Pedersen; Ulrik Jaeger |
| Abstract |
The development of IGBT devices is still moving ahead faster devices with lower losses. This paper will focus on detailed characterization and comparison of six different IGBT -modules representing state-of-the-art for both PT and NPT technologies. The characterization is done on an advanced measurement system. The characterization is based on static and dynamic tests for IGBT's and diodes in the IGBT-modules. Short circuit tests are performed including both non-destructive and destructive tests. The comparison is based on conduction losses, switching losses, reverse recovery peak current, reverse recovery energy and short circuit behaviour of the devices. Finally, the devices are compared in inverter-applications. |
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| Filename: | Unnamed file |
| Filesize: | 457 KB |
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| Type |
Members Only |
| Date |
Last modified 2018-04-12 by System |
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