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   ANALYSIS OF THE IGBT dV/dt IN HARD SWITCIDNG MODE   [View] 
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 Author(s)   F. CaImon; J. P. Chante; B. Reymond; A. Senes 
 Abstract   Based on the physical analysis of the device behaviour, we explain the influence of the IGBT technology (PT or NPT device) and the experimental conditions (junction temperature, load current, gate resistance) on the IGBT voltage rise during the turn-off phase in the hard switching mode without snubber (inductive load). This study has been performed using IGBT experimental measurements and two-dimensional device simulations. The results presented in this paper can allow the users to forecast the dV/dt slope variations. 
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Filename:Unnamed file
Filesize:419.7 KB
 Type   Members Only 
 Date   Last modified 2018-04-12 by System