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STANDARD AND SHORTED ANODE NON-PUNCH-THROUGH EMITTER SWITCHED THYRISTORS
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| Author(s) |
D. Flores; P. Godignon; M. Vellvehi; J. Fernandez; S. Hidalgo; J. Rebollo; J. Millan |
| Abstract |
This paper is aimed at the analysis of the electrical characterisitics of non-punch-through EST structures. The operation moide and the transient process are studied by means of 2D numerical simulations. Standard and shorted anode test structures were fabricated with a conventional IGBT process technology, and their characteristics are compared with those of IGBT and BRT structures. It is shown the improvement of the EST turnoff time when including the shorted anode structure, and the dependence of the maximum controllable current on the device geometrical dimensions. |
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| Filesize: | 557.8 KB |
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| Type |
Members Only |
| Date |
Last modified 2018-04-09 by System |
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