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Influence of repetitions of short-circuits conditions on IGBT lifetime
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| Author(s) |
F. Saint-Eve; S. Lefebvre; Z. Khatir |
| Abstract |
The paper deals with the behaviour of PT and NPT IGBTs under repetitive short-circuit
operations. The repetition of these severe working conditions is responsible for one mode of devices
ageing and results unavoidably in the components failures. A long term campaign of experimental
tests was made in order to determine the number of short circuit operations the devices can support
before failure for different dissipated energies during the Short Circuit tests. The results show the very
good ability of these devices to work in short circuit operations when the dissipated energy is lower
than a particular critical energy. |
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| Filename: | EPE2003-PP0185 - Saint-Eve |
| Filesize: | 1.002 MB |
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| Type |
Members Only |
| Date |
Last modified 2004-02-04 by Unknown |
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