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On-Line Semiconductor Switching Loss Measurement System for an Advanced Condition Monitoring Concept
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| Author(s) |
Tobias KRONE |
| Abstract |
In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results. |
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| Filename: | 0430-epe2016-full-20452477.pdf |
| Filesize: | 2.337 MB |
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| Type |
Members Only |
| Date |
Last modified 2017-04-13 by System |
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