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Vce-based chip temperature estimation methods for high power IGBT modules during power cycling - A comparison
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| Author(s) |
Anastasios AMOIRIDIS |
| Abstract |
Temperature estimation is of great importance for performance and reliability of IGBT power modulesin converter operation as well as in active power cycling tests. It is common to be estimated throughThermo-Sensitive Electrical Parameters such as the forward voltage drop (Vce) of the chip. This experi-mental work evaluates the validity and accuracy of two Vce based methods applied on high power IGBTmodules during power cycling tests. The first method estimates the chip temperature when low sensecurrent is applied and the second method when normal load current is present. Finally, a correctionfactor that eliminates the series resistance contribution on the Vce measured at high current, is proposed. |
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| Filename: | 0600-epe2015-full-17394826.pdf |
| Filesize: | 2.481 MB |
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| Type |
Members Only |
| Date |
Last modified 2016-06-08 by System |
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